How do I measure the loss value of a junction box
This value is measured according to JEDEC (JESD51-12) Method 2 and uses 1) the temperature difference between the junction and the measurement point on the case (which is often the center of the package) and 2) the total power dissipated in the device, but not the power flowing. Some semiconductor devices are integrated with a dedicated thermal diode precisely measure the junction temperature according to the calibrated forward voltage versus the temperature curve. Since loss is determined by integration of voltage and current as shown in the following expression, loss occurs due to the influence of collector-emitter saturation voltage VCE (sat) even in conduction. This application note demonstrates both analytical and simulation-based methods for determining device power losses and junc te conduction losses and switching losses.
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